Perfect light absorption in ultra-thin silicon optical nanocavity and its application for color filters

Seyed Sadreddin Mirshafieyan; Ting S. Luk; Junpeng Guo

doi:10.1364/FIO.2016.JW4A.162

Perfect light absorption in ultra-thin silicon optical nanocavity and its application for color filters

Seyed Sadreddin Mirshafieyan
, Ting S. Luk
, Junpeng Guo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

We investigated perfect light absorption in silicon optical nanocavity comprising of ultrathin aluminum and silicon films deposited on an aluminum surface. The thickness of the silicon film cavity is 1/18 of the perfect absorption wavelength.

Original language	English
Title of host publication	Optics InfoBase Conference Papers
DOIs	https://doi.org/10.1364/FIO.2016.JW4A.162
State	Published - Jan 1 2016
Externally published	Yes

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10.1364/FIO.2016.JW4A.162

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title = "Perfect light absorption in ultra-thin silicon optical nanocavity and its application for color filters",

abstract = "We investigated perfect light absorption in silicon optical nanocavity comprising of ultrathin aluminum and silicon films deposited on an aluminum surface. The thickness of the silicon film cavity is 1/18 of the perfect absorption wavelength.",

author = "Mirshafieyan, \{Seyed Sadreddin\} and Luk, \{Ting S.\} and Junpeng Guo",

year = "2016",

month = jan,

day = "1",

doi = "10.1364/FIO.2016.JW4A.162",

language = "English",

isbn = "9781943580194",

booktitle = "Optics InfoBase Conference Papers",

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AU - Mirshafieyan, Seyed Sadreddin

AU - Luk, Ting S.

AU - Guo, Junpeng

PY - 2016/1/1

Y1 - 2016/1/1

N2 - We investigated perfect light absorption in silicon optical nanocavity comprising of ultrathin aluminum and silicon films deposited on an aluminum surface. The thickness of the silicon film cavity is 1/18 of the perfect absorption wavelength.

AB - We investigated perfect light absorption in silicon optical nanocavity comprising of ultrathin aluminum and silicon films deposited on an aluminum surface. The thickness of the silicon film cavity is 1/18 of the perfect absorption wavelength.

UR - https://www.scopus.com/pages/publications/85041917832

U2 - 10.1364/FIO.2016.JW4A.162

DO - 10.1364/FIO.2016.JW4A.162

M3 - Conference contribution

SN - 9781943580194

BT - Optics InfoBase Conference Papers

ER -

Perfect light absorption in ultra-thin silicon optical nanocavity and its application for color filters

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