Abstract
We investigate flux-grown Sm-deficient SmxB6 (x<1) by global and local tools, including x-ray diffraction (XRD), electronic transport, and scanning tunneling microscopy (STM) and spectroscopy (STS). All these tools indicate a remarkable persistence of the SmB6 local structure in the flux-grown samples even for nominal Sm concentrations as low as x=0.75. As a consequence, the overall electronic properties of SmxB6, and particularly the surface conductance at low temperature, are only affected locally by the Sm deficiency.
| Original language | English |
|---|---|
| Article number | 044204 |
| Journal | Physical Review Materials |
| Volume | 5 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 1 2021 |
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