Probing silicate/sapphire interfaces with AFM and nanoindentation

E. T. Lilleodden; A. V. Zagrebelny; S. Ramamurthy; C. B. Carter

doi:10.1557/proc-436-177

Probing silicate/sapphire interfaces with AFM and nanoindentation

E. T. Lilleodden
, A. V. Zagrebelny
, S. Ramamurthy
, C. B. Carter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A nanoindentation study of a calcium-aluminosilicate/α-alumina system is described. Thin-films of CaAl2Si2O8 glass were deposited on α-alumina single crystals of {112̄0} and {11̄02} orientations by pulsed-laser deposition. These samples were then subjected to a heat treatment causing the glass to crystallize and to dewet the sapphire surface. A nanoindentation device retrofitted on an atomic force microscope was employed to probe the mechanical properties of the samples. It uniquely enables the characterization of sub-micron features such as the dewet crystallites which necessitate small displacements and exact positioning of the indenter. Strong dependencies on the crystallographic anisotropy were observed in the morphology, but less so on the mechanical properties. In addition, displacement-excursions were observed and are explained in terms of yielding in the substrate.

Original language	English
Title of host publication	Materials Research Society Symposium - Proceedings
Volume	436
DOIs	https://doi.org/10.1557/proc-436-177
State	Published - Jan 1 1996
Externally published	Yes

Access to Document

10.1557/proc-436-177

Cite this

@inproceedings{094c4a313b384a1eaf3eb245bacdc224,

title = "Probing silicate/sapphire interfaces with AFM and nanoindentation",

abstract = "A nanoindentation study of a calcium-aluminosilicate/α-alumina system is described. Thin-films of CaAl2Si2O8 glass were deposited on α-alumina single crystals of \{11{\=2}0\} and \{1{\=1}02\} orientations by pulsed-laser deposition. These samples were then subjected to a heat treatment causing the glass to crystallize and to dewet the sapphire surface. A nanoindentation device retrofitted on an atomic force microscope was employed to probe the mechanical properties of the samples. It uniquely enables the characterization of sub-micron features such as the dewet crystallites which necessitate small displacements and exact positioning of the indenter. Strong dependencies on the crystallographic anisotropy were observed in the morphology, but less so on the mechanical properties. In addition, displacement-excursions were observed and are explained in terms of yielding in the substrate.",

author = "Lilleodden, \{E. T.\} and Zagrebelny, \{A. V.\} and S. Ramamurthy and Carter, \{C. B.\}",

year = "1996",

month = jan,

day = "1",

doi = "10.1557/proc-436-177",

language = "English",

volume = "436",

booktitle = "Materials Research Society Symposium - Proceedings",

}

TY - GEN

T1 - Probing silicate/sapphire interfaces with AFM and nanoindentation

AU - Lilleodden, E. T.

AU - Zagrebelny, A. V.

AU - Ramamurthy, S.

AU - Carter, C. B.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - A nanoindentation study of a calcium-aluminosilicate/α-alumina system is described. Thin-films of CaAl2Si2O8 glass were deposited on α-alumina single crystals of {112̄0} and {11̄02} orientations by pulsed-laser deposition. These samples were then subjected to a heat treatment causing the glass to crystallize and to dewet the sapphire surface. A nanoindentation device retrofitted on an atomic force microscope was employed to probe the mechanical properties of the samples. It uniquely enables the characterization of sub-micron features such as the dewet crystallites which necessitate small displacements and exact positioning of the indenter. Strong dependencies on the crystallographic anisotropy were observed in the morphology, but less so on the mechanical properties. In addition, displacement-excursions were observed and are explained in terms of yielding in the substrate.

AB - A nanoindentation study of a calcium-aluminosilicate/α-alumina system is described. Thin-films of CaAl2Si2O8 glass were deposited on α-alumina single crystals of {112̄0} and {11̄02} orientations by pulsed-laser deposition. These samples were then subjected to a heat treatment causing the glass to crystallize and to dewet the sapphire surface. A nanoindentation device retrofitted on an atomic force microscope was employed to probe the mechanical properties of the samples. It uniquely enables the characterization of sub-micron features such as the dewet crystallites which necessitate small displacements and exact positioning of the indenter. Strong dependencies on the crystallographic anisotropy were observed in the morphology, but less so on the mechanical properties. In addition, displacement-excursions were observed and are explained in terms of yielding in the substrate.

UR - https://www.scopus.com/pages/publications/0030419715

U2 - 10.1557/proc-436-177

DO - 10.1557/proc-436-177

M3 - Conference contribution

VL - 436

BT - Materials Research Society Symposium - Proceedings

ER -

Probing silicate/sapphire interfaces with AFM and nanoindentation

Abstract

Access to Document

Fingerprint

Cite this