Progress in micron-scale field emission models based on nanoscale surface characterization for use in PIC-DSMC vacuum arc simulations

3D Particle-In-Cell Direct Simulation Monte Carlo (PIC-DSMC) simulations of cm-sized devices cannot resolve atomic-scale (nm) surface features and thus one must generate micron-scale models for an effective “local” work function, field enhancement factor, and emission area. Here we report on development of a stochastic effective model based on atomic-scale characterization of as-built electrode surfaces. Representative probability density distributions of the work function and geometric field enhancement factor (beta) for a sputter-deposited Pt surface are generated from atomic-scale surface characterization using Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Photoemission Electron Microscopy (PEEM). In the micron-scale model every simulated PIC-DSMC surface element draws work functions and betas for many independent “atomic emitters”. During the simulation the field emitted current from an element is computed by summing each “atomic emitter's” current. This model has reasonable agreement with measured micron-scale emitted currents across a range of electric field values.