Quantitative Hrtem of Twin Boundaries in Compound Semiconductors and Metals Using Non-Linear Least-Squares Methods

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Original language	English
Title of host publication	Microscopy and Microanalysis
Pages	784-785
Number of pages	2
Volume	4
Edition	2 S
DOIs	https://doi.org/10.1017/S1431927600024041
State	Published - Jul 1 1998
Externally published	Yes

Access to Document

@inproceedings{bef5f8367d3e45e0b867e16525adde59,

title = "Quantitative Hrtem of Twin Boundaries in Compound Semiconductors and Metals Using Non-Linear Least-Squares Methods",

author = "Dov Cohen and Campbell, \{Geoffrey H.\} and King, \{Wayne E.\} and Carter, \{C. Barry\}",

year = "1998",

month = jul,

day = "1",

doi = "10.1017/S1431927600024041",

language = "English",

volume = "4",

pages = "784--785",

booktitle = "Microscopy and Microanalysis",

edition = "2 S",

}

TY - GEN

T1 - Quantitative Hrtem of Twin Boundaries in Compound Semiconductors and Metals Using Non-Linear Least-Squares Methods

AU - Cohen, Dov

AU - Campbell, Geoffrey H.

AU - King, Wayne E.

AU - Carter, C. Barry

PY - 1998/7/1

Y1 - 1998/7/1

UR - https://www.scopus.com/pages/publications/85169172917

U2 - 10.1017/S1431927600024041

DO - 10.1017/S1431927600024041

M3 - Conference contribution

VL - 4

SP - 784

EP - 785

BT - Microscopy and Microanalysis

ER -