Reaction couples of ceramic thin films prepared by CVD

David W. Susnitzky; Scott R. Summerfelt; C. Barry Carter

doi:10.1016/0304-3991(89)90193-9

Reaction couples of ceramic thin films prepared by CVD

David W. Susnitzky
, Scott R. Summerfelt
, C. Barry Carter

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A thin-film reaction-couple experiment has been designed for monitoring solid-state reactions in the electron microscope. NiO particles were deposited by chemical-vapor deposition onto bulk α-Al2O3 substrates and electron-transparent α-Al2O3 thin films. The NiO-α-Al2O3 reaction couples were then annealed and the formation and growth of NiAl2O4 were analyzed. Special crystallographic relations have been determined, and effects associated with phase transformation were examined. The experiment allows both NiO/NiAl2O4 and NiAl2O4/α-Al2O3 interfaces to be analyzed from the same reaction couple and provides the opportunity to characterize phase transformation kinetics for a particular interface structure. © 1989.

Original language	English
Pages (from-to)	249-255
Number of pages	7
Journal	Ultramicroscopy
Volume	30
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-3991(89)90193-9
State	Published - Jan 1 1989
Externally published	Yes

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title = "Reaction couples of ceramic thin films prepared by CVD",

abstract = "A thin-film reaction-couple experiment has been designed for monitoring solid-state reactions in the electron microscope. NiO particles were deposited by chemical-vapor deposition onto bulk α-Al2O3 substrates and electron-transparent α-Al2O3 thin films. The NiO-α-Al2O3 reaction couples were then annealed and the formation and growth of NiAl2O4 were analyzed. Special crystallographic relations have been determined, and effects associated with phase transformation were examined. The experiment allows both NiO/NiAl2O4 and NiAl2O4/α-Al2O3 interfaces to be analyzed from the same reaction couple and provides the opportunity to characterize phase transformation kinetics for a particular interface structure. {\textcopyright} 1989.",

author = "Susnitzky, \{David W.\} and Summerfelt, \{Scott R.\} and \{Barry Carter\}, C.",

year = "1989",

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doi = "10.1016/0304-3991(89)90193-9",

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TY - JOUR

T1 - Reaction couples of ceramic thin films prepared by CVD

AU - Susnitzky, David W.

AU - Summerfelt, Scott R.

AU - Barry Carter, C.

PY - 1989/1/1

Y1 - 1989/1/1

N2 - A thin-film reaction-couple experiment has been designed for monitoring solid-state reactions in the electron microscope. NiO particles were deposited by chemical-vapor deposition onto bulk α-Al2O3 substrates and electron-transparent α-Al2O3 thin films. The NiO-α-Al2O3 reaction couples were then annealed and the formation and growth of NiAl2O4 were analyzed. Special crystallographic relations have been determined, and effects associated with phase transformation were examined. The experiment allows both NiO/NiAl2O4 and NiAl2O4/α-Al2O3 interfaces to be analyzed from the same reaction couple and provides the opportunity to characterize phase transformation kinetics for a particular interface structure. © 1989.

AB - A thin-film reaction-couple experiment has been designed for monitoring solid-state reactions in the electron microscope. NiO particles were deposited by chemical-vapor deposition onto bulk α-Al2O3 substrates and electron-transparent α-Al2O3 thin films. The NiO-α-Al2O3 reaction couples were then annealed and the formation and growth of NiAl2O4 were analyzed. Special crystallographic relations have been determined, and effects associated with phase transformation were examined. The experiment allows both NiO/NiAl2O4 and NiAl2O4/α-Al2O3 interfaces to be analyzed from the same reaction couple and provides the opportunity to characterize phase transformation kinetics for a particular interface structure. © 1989.

UR - https://www.scopus.com/pages/publications/0024680146

U2 - 10.1016/0304-3991(89)90193-9

DO - 10.1016/0304-3991(89)90193-9

M3 - Article

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VL - 30

SP - 249

EP - 255

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-2

ER -

Reaction couples of ceramic thin films prepared by CVD

Abstract

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