Skip to main navigation Skip to search Skip to main content

Reflectivity, GI-SAS and GI-Diffraction: X-Ray

  • M. Ree
  • , D. M. Kim
  • , J. Jung
  • , Y. Rho
  • , B. Ahn
  • , S. Jin
  • , M. Kim

Research output: Other contributionpeer-review

3 Scopus citations

Abstract

One of the features of X-rays is the penetration power into matter, revealing the invisible interior of complex objects. Moreover, X-rays are a critical tool to investigate material structures and properties because of the electromagnetic radiation that is able to interact with matter having an electromagnetic nature. In particular, X-ray reflectivity (XR) and grazing incidence X-ray scattering (GIXS) are powerful, nondestructive techniques for examining the structure and properties of materials including various kinds of polymers and their nanostructures and nanosize specimens. These techniques have become more powerful for understanding nanostructures and objects in nanosize by using synchrotron radiation sources. Their fundamental theories and applications in polymer science are given and discussed. © 2012 Elsevier B.V. All rights reserved.
Original languageEnglish
DOIs
StatePublished - Dec 1 2012
Externally publishedYes

Fingerprint

Dive into the research topics of 'Reflectivity, GI-SAS and GI-Diffraction: X-Ray'. Together they form a unique fingerprint.

Cite this