Abstract
A transmission-electron-microscope strong-beam technique is used to investigate the rigid-body translation across {110} antiphase boundaries in GaAs. The results show a translation in the.
| Original language | English |
|---|---|
| Pages (from-to) | 2629-2632 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 66 |
| Issue number | 20 |
| DOIs | |
| State | Published - Jan 1 1991 |
| Externally published | Yes |
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