Abstract
Multidimensional coherent spectroscopy measurements of SiV- centers in diamond reveal a previously unexamined population of silicon-based defect states, which are not detected in photoluminescence and which exhibit a substantial degree of inhomogeneous broadening.
| Original language | English |
|---|---|
| Title of host publication | Optics InfoBase Conference Papers |
| Volume | Part F93-CLEO_QELS 2018 |
| DOIs | |
| State | Published - Jan 1 2018 |
| Externally published | Yes |
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