Single-Crystal Synthesis and Characterization of Copper-Intercalated ZrTe<inf>5</inf>

Herein is presented the synthesis and characterization of copper-intercalated zirconium pentatelluride (ZrTe5). ZrTe5:Cu0.05 crystals are synthesized by the chemical vapor transport method in a vacuum. X-ray diffraction and elemental analysis techniques are utilized to validate the synthesis. The results indicate that the intercalation of the layered Zr/Te structure with copper atoms causes the contraction of the unit cell along all three crystalline directions, the shrinkage of the overall volume of the unit cell, and the distortion of the unit cell. A single crystal was isolated, mechanically exfoliated, and used for the measurements of intercalation strains in a Hall bar device. Electronic transport studies indicate that an anomalous resistance drop is observed at T = 19 K. Furthermore, Rxx and Rxy results, respectively, indicate a probable disorder-induced localization effect and electron-type carriers.