Abstract
Using single-shot, self-diffraction, frequency-resolved optical gating, we measure the complete electric field amplitude and phase of 405-nm second-harmonic pulses from an amplified Ti:sapphire system. The single-shot frequency-resolved optical gating device gives both qualitative and quantitative information, which is useful for analyzing and optimizing the grating compressor in the chirped-pulse amplification system.
| Original language | English |
|---|---|
| Pages (from-to) | 67-69 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 20 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1 1995 |
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