Abstract
Solution deposition planarization (SDP) is studied for preparing smooth flexible substrates in multimeter lengths. We demonstrate 0.5 nm rms surface roughness starting from unpolished metal tapes and a correlation of substrate roughness with the texture of subsequent ion-beam aligned films. Surface roughness reduction in SDP is modeled via film shrinkage during solution deposition and a residual roughness based on film thickness. Use of solution deposited a Y2O3 to planarize substrates prior to ion-beam textured MgO growth shows an in-plane texture of MgO down to 4°. Utilizing these templates, we demonstrated superconducting YBa2 Cu3 Oy coated conductors with critical current densities of 2.8-4.0 MA/cm2 at 75 K.
| Original language | English |
|---|---|
| Article number | 071907 |
| Journal | Applied Physics Letters |
| Volume | 98 |
| Issue number | 7 |
| DOIs | |
| State | Published - Feb 14 2011 |
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