Spectral imaging and multivariate statistical analysis from thin specimens in the SEM with a four-channel silicon drift detector

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Scopus citations

Original language	English
Title of host publication	Microscopy and Microanalysis
Pages	1390-1391
Number of pages	2
Volume	12
Edition	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606066955
State	Published - Aug 1 2006
Externally published	Yes

Access to Document

@inproceedings{487f64b7eb6b4ddca878a39cb75092ce,

title = "Spectral imaging and multivariate statistical analysis from thin specimens in the SEM with a four-channel silicon drift detector",

author = "Kotula, \{P. G.\} and Michael, \{J. R.\}",

year = "2006",

month = aug,

day = "1",

doi = "10.1017/S1431927606066955",

language = "English",

volume = "12",

pages = "1390--1391",

booktitle = "Microscopy and Microanalysis",

edition = "SUPPL. 2",

}

TY - GEN

T1 - Spectral imaging and multivariate statistical analysis from thin specimens in the SEM with a four-channel silicon drift detector

AU - Kotula, P. G.

AU - Michael, J. R.

PY - 2006/8/1

Y1 - 2006/8/1

UR - https://www.scopus.com/pages/publications/33750881929

U2 - 10.1017/S1431927606066955

DO - 10.1017/S1431927606066955

M3 - Conference contribution

VL - 12

SP - 1390

EP - 1391

BT - Microscopy and Microanalysis

ER -