Spectral imaging with an annular Si-drift detector and annular x-ray detector simulated by stage and scan rotation in the SEM

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Microscopy and Microanalysis
Pages	768-769
Number of pages	2
Volume	14
Edition	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608081762
State	Published - Aug 1 2008
Externally published	Yes

Access to Document

@inproceedings{c0de8bd5cd954d0dbe6e631e117bafc5,

title = "Spectral imaging with an annular Si-drift detector and annular x-ray detector simulated by stage and scan rotation in the SEM",

author = "Kotula, \{P. G.\}",

year = "2008",

month = aug,

day = "1",

doi = "10.1017/S1431927608081762",

language = "English",

volume = "14",

pages = "768--769",

booktitle = "Microscopy and Microanalysis",

edition = "SUPPL. 2",

}

TY - GEN

T1 - Spectral imaging with an annular Si-drift detector and annular x-ray detector simulated by stage and scan rotation in the SEM

AU - Kotula, P. G.

PY - 2008/8/1

Y1 - 2008/8/1

UR - https://www.scopus.com/pages/publications/49549121382

U2 - 10.1017/S1431927608081762

DO - 10.1017/S1431927608081762

M3 - Conference contribution

VL - 14

SP - 768

EP - 769

BT - Microscopy and Microanalysis

ER -