Abstract
In this paper, we present a brief survey of stress effects on dewetting. For this purpose, i we develop a simple thermodynamic model to illustrate stress effects ii we study stress effects in strained-Silicon-On-Insulator (s-SOI) thin films by means of Low Energy Electron Microscopy, and Atomic Force Microscopy iii we discuss some available data. In particular, we show that while for s-SOI the strain only provides a relatively small contribution to the total driving force for dewetting, in some other cases stress can really dominate the driving force for the dewetting. Copyright © 2012 Inderscience Enterprises Ltd.
| Original language | English |
|---|---|
| Pages (from-to) | 396-411 |
| Number of pages | 16 |
| Journal | International Journal of Nanotechnology |
| Volume | 9 |
| Issue number | 3-7 |
| DOIs | |
| State | Published - Jan 1 2012 |
| Externally published | Yes |
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