Abstract
In the study, thin films of cobalt oxide were grown onto single-crystal yttria-stabilized zirconia (YSZ) substrates of (100) orientation. Pulse repetition rate and substrate temperature were varied independently, and their effect on the growth morphology of the films was studied. The films were characterized by conventional transmission electron microscopy (TEM) and high resolution TEM (HRTEM). Both plan-view and cross-section TEM samples were studied.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Pages | 1154-1155 |
| Number of pages | 2 |
| State | Published - Dec 1 1993 |
| Externally published | Yes |
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