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Study of cobalt oxide films deposited on single-crystal yttria-stabilized zirconia by pulsed-laser ablation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

In the study, thin films of cobalt oxide were grown onto single-crystal yttria-stabilized zirconia (YSZ) substrates of (100) orientation. Pulse repetition rate and substrate temperature were varied independently, and their effect on the growth morphology of the films was studied. The films were characterized by conventional transmission electron microscopy (TEM) and high resolution TEM (HRTEM). Both plan-view and cross-section TEM samples were studied.
Original languageEnglish
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
Pages1154-1155
Number of pages2
StatePublished - Dec 1 1993
Externally publishedYes

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