Abstract
The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazing-incidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires plated shape with the 110-orientation are aligned perpendicular to the ITO film with principal reflections at (002), (100), (101), (201), and Raman spectroscopy vibrational modes at E12g at 378 cm-1 and A1g at 407 cm-1 correspond to 2H-MoS2. APT reveals MoS+2, MoS+3 as predominant evaporated molecular ions on the sample, indicating no significant diffusion/segregation of Mo or S species within the ITO layer.
| Original language | English |
|---|---|
| Pages (from-to) | 1261-1266 |
| Number of pages | 6 |
| Journal | MRS Communications |
| Volume | 9 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jan 1 2019 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Study of indium tin oxide-MoS<inf>2</inf> interface by atom probe tomography'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver