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Study of indium tin oxide-MoS<inf>2</inf> interface by atom probe tomography

  • Manuel Ramos
  • , John Nogan
  • , Torben Boll
  • , Sandra Kauffmann-Weiss
  • , Claudia A. Rodriguez-Gonzalez
  • , Jose L. Enriquez-Carrejo
  • , Martin Heilmaier

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazing-incidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires plated shape with the 110-orientation are aligned perpendicular to the ITO film with principal reflections at (002), (100), (101), (201), and Raman spectroscopy vibrational modes at E12g at 378 cm-1 and A1g at 407 cm-1 correspond to 2H-MoS2. APT reveals MoS+2, MoS+3 as predominant evaporated molecular ions on the sample, indicating no significant diffusion/segregation of Mo or S species within the ITO layer.
Original languageEnglish
Pages (from-to)1261-1266
Number of pages6
JournalMRS Communications
Volume9
Issue number4
DOIs
StatePublished - Jan 1 2019
Externally publishedYes

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