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Surface film softening effects in MoSi2

  • C. M. Czarnik
  • , R. Gibala
  • , M. A. Nastasi
  • , R. B. Schwarz
  • , S. R. Srinivasan
  • , J. J. Petrovic

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

Surface film softening, which is associated with the generation of mobile dislocations at a film-substrate interface and their motion into the substrate, has been demonstrated previously for bcc metals and B2 ordered alloy substrates. MoSi2 exhibits features of limited dislocation mobility and plasticity similar to these materials and would also be expected to exhibit film-enhanced plasticity, but at much higher temperatures. In this investigation, 150 nm thick films of SiO2, MoSi2 and ZrO2 were deposited on MoSi2 substrates by electron beam deposition at approximately 50 °C in an attempt to observe film softening. In initial experiments, hot hardness testing was utilized primarily to maintain deformation conditions characteristic of dislocation glide. ZrO2-coated MoSi2 demonstrates a large film-induced softening in hardness tests carried out at 0.5-1 kgf loads over the temperature range 25-1300 °C.

Original languageEnglish
Pages (from-to)597-602
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume288
DOIs
StatePublished - Jan 1 1992
EventProceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials -
Duration: Jan 1 1993 → …

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