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Temperature dependence of laser threshold in an InGaAsN vertical-cavity surface-emitting laser

  • H. C. Schneider
  • , A. J. Fischer
  • , W. W. Chow
  • , J. F. Klem

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

We present theoretical and experimental results for the temperature dependence of threshold current in an InGaAsN/GaAs vertical-cavity surface-emitting laser (VCSEL) operating at 1.3 μm under continuous-wave current injection. Using a microscopic many-body laser theory, good agreement with experimental data is obtained. The influence of radiative and nonradiative recombination processes on the threshold current-density is investigated theoretically. Also, comparison to a GaAs/AlGaAs VCSEL emitting at 850 nm is made. © 2001 American Institute of Physics.
Original languageEnglish
Pages (from-to)3391-3393
Number of pages3
JournalApplied Physics Letters
Volume78
Issue number22
DOIs
StatePublished - May 28 2001
Externally publishedYes

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