Terahertz microscopy with submicrometre resolution

Roland Kersting; Houtong Chen; Nicholas Karpowicz; Gyu Cheon Cho

doi:10.1088/1464-4258/7/2/024

Terahertz microscopy with submicrometre resolution

Roland Kersting
, Houtong Chen
, Nicholas Karpowicz
, Gyu Cheon Cho

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

We present a terahertz near-field microscope which may serve as a contactless probe for identifying the dielectric properties of individual quantum systems. Terahertz images of organic and inorganic structures demonstrate the applicability on objects of submicron size. Spatial resolutions down to 150 nm have been achieved. The unexpectedly high image contrast results from a novel near-field imaging process.

Original language	English
Journal	Journal of Optics A: Pure and Applied Optics
Volume	7
Issue number	2
DOIs	https://doi.org/10.1088/1464-4258/7/2/024
State	Published - Feb 1 2005
Externally published	Yes

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10.1088/1464-4258/7/2/024

Cite this

@article{0903b9cdbacb43b2803d7b95d8c8a0fe,

title = "Terahertz microscopy with submicrometre resolution",

abstract = "We present a terahertz near-field microscope which may serve as a contactless probe for identifying the dielectric properties of individual quantum systems. Terahertz images of organic and inorganic structures demonstrate the applicability on objects of submicron size. Spatial resolutions down to 150 nm have been achieved. The unexpectedly high image contrast results from a novel near-field imaging process.",

author = "Roland Kersting and Houtong Chen and Nicholas Karpowicz and Cho, \{Gyu Cheon\}",

year = "2005",

month = feb,

day = "1",

doi = "10.1088/1464-4258/7/2/024",

language = "English",

volume = "7",

journal = "Journal of Optics A: Pure and Applied Optics",

issn = "1464-4258",

publisher = "IOP Publishing Ltd.",

number = "2",

}

TY - JOUR

T1 - Terahertz microscopy with submicrometre resolution

AU - Kersting, Roland

AU - Chen, Houtong

AU - Karpowicz, Nicholas

AU - Cho, Gyu Cheon

PY - 2005/2/1

Y1 - 2005/2/1

N2 - We present a terahertz near-field microscope which may serve as a contactless probe for identifying the dielectric properties of individual quantum systems. Terahertz images of organic and inorganic structures demonstrate the applicability on objects of submicron size. Spatial resolutions down to 150 nm have been achieved. The unexpectedly high image contrast results from a novel near-field imaging process.

AB - We present a terahertz near-field microscope which may serve as a contactless probe for identifying the dielectric properties of individual quantum systems. Terahertz images of organic and inorganic structures demonstrate the applicability on objects of submicron size. Spatial resolutions down to 150 nm have been achieved. The unexpectedly high image contrast results from a novel near-field imaging process.

UR - https://www.scopus.com/pages/publications/24144440964

U2 - 10.1088/1464-4258/7/2/024

DO - 10.1088/1464-4258/7/2/024

M3 - Article

SN - 1464-4258

VL - 7

JO - Journal of Optics A: Pure and Applied Optics

JF - Journal of Optics A: Pure and Applied Optics

IS - 2

ER -

Terahertz microscopy with submicrometre resolution

Abstract

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