Test simulation of neutron damage to electronic components using accelerator facilities

D. King; E. Bielejec; C. Hembree; K. McDonald; R. Fleming; W. Wampler; G. Vizkelethy; T. Sheridan; V. Harper-Slaboszewicz; P. Griffin

Test simulation of neutron damage to electronic components using accelerator facilities

D. King
, E. Bielejec
, C. Hembree
, K. McDonald
, R. Fleming
, W. Wampler
, G. Vizkelethy
, T. Sheridan
, V. Harper-Slaboszewicz
, P. Griffin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

The concept of "equivalent" damage in electronics when comparing accelerator and fast neutron irradiation is a topic of much interest. Sandia National Laboratories has an ongoing effort to use accelerator facilities to simulate transient defect populations generated from displacement damage and ionization effects observed in electronics at fast burst neutron facilities. This paper examines the utility of two accelerator facilities that will be used to simulate neutron induced damage and ionization when performing transistor tests. Physics based modeling comparisons of the test results will also be presented.

Original language	English
Title of host publication	International Topical Meeting on Nuclear Research Applications and Utilization of Accelerators
State	Published - Dec 1 2009
Externally published	Yes

Cite this

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title = "Test simulation of neutron damage to electronic components using accelerator facilities",

abstract = "The concept of {"}equivalent{"} damage in electronics when comparing accelerator and fast neutron irradiation is a topic of much interest. Sandia National Laboratories has an ongoing effort to use accelerator facilities to simulate transient defect populations generated from displacement damage and ionization effects observed in electronics at fast burst neutron facilities. This paper examines the utility of two accelerator facilities that will be used to simulate neutron induced damage and ionization when performing transistor tests. Physics based modeling comparisons of the test results will also be presented.",

author = "D. King and E. Bielejec and C. Hembree and K. McDonald and R. Fleming and W. Wampler and G. Vizkelethy and T. Sheridan and V. Harper-Slaboszewicz and P. Griffin",

year = "2009",

month = dec,

day = "1",

language = "English",

isbn = "9789201504104",

booktitle = "International Topical Meeting on Nuclear Research Applications and Utilization of Accelerators",

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TY - GEN

T1 - Test simulation of neutron damage to electronic components using accelerator facilities

AU - King, D.

AU - Bielejec, E.

AU - Hembree, C.

AU - McDonald, K.

AU - Fleming, R.

AU - Wampler, W.

AU - Vizkelethy, G.

AU - Sheridan, T.

AU - Harper-Slaboszewicz, V.

AU - Griffin, P.

PY - 2009/12/1

Y1 - 2009/12/1

N2 - The concept of "equivalent" damage in electronics when comparing accelerator and fast neutron irradiation is a topic of much interest. Sandia National Laboratories has an ongoing effort to use accelerator facilities to simulate transient defect populations generated from displacement damage and ionization effects observed in electronics at fast burst neutron facilities. This paper examines the utility of two accelerator facilities that will be used to simulate neutron induced damage and ionization when performing transistor tests. Physics based modeling comparisons of the test results will also be presented.

AB - The concept of "equivalent" damage in electronics when comparing accelerator and fast neutron irradiation is a topic of much interest. Sandia National Laboratories has an ongoing effort to use accelerator facilities to simulate transient defect populations generated from displacement damage and ionization effects observed in electronics at fast burst neutron facilities. This paper examines the utility of two accelerator facilities that will be used to simulate neutron induced damage and ionization when performing transistor tests. Physics based modeling comparisons of the test results will also be presented.

UR - https://www.scopus.com/pages/publications/79952813169

M3 - Conference contribution

SN - 9789201504104

BT - International Topical Meeting on Nuclear Research Applications and Utilization of Accelerators

ER -

Test simulation of neutron damage to electronic components using accelerator facilities

Abstract

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