Abstract
Interfaces are good traps for implanted He and radiation induced damage, and understanding the role of interfaces is important for designing highly radiation-resistant materials. In this article, Nb sheet and Nb film on MgO substrate (Nb/MgO) are irradiated by He ions, and it is found that the He bubble distribution along radiation depth between Nb sheet and Nb/MgO film is different. The comparison reveals that this difference is resulted from the diffusion of He atoms driven by strain gradient in Nb film close to Nb/MgO interface. This study could provide novel mechanisms for further understanding the interface enhancing radiation tolerance.
| Original language | English |
|---|---|
| Pages (from-to) | 1014-1018 |
| Number of pages | 5 |
| Journal | Applied Surface Science |
| Volume | 465 |
| DOIs | |
| State | Published - Jan 28 2019 |
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