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The alleviation of radiation-damage on Nb/MgO film driven by strain gradient in He ion irradiation

  • J. L. Du
  • , Y. H. Qiu
  • , J. Zhang
  • , J. C. Huang
  • , Z. M. Wu
  • , X. F. Zhang
  • , Y. H. Wang
  • , Jon K. Baldwin
  • , Y. Q. Wang
  • , Y. G. Wang
  • , E. G. Fu

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

Interfaces are good traps for implanted He and radiation induced damage, and understanding the role of interfaces is important for designing highly radiation-resistant materials. In this article, Nb sheet and Nb film on MgO substrate (Nb/MgO) are irradiated by He ions, and it is found that the He bubble distribution along radiation depth between Nb sheet and Nb/MgO film is different. The comparison reveals that this difference is resulted from the diffusion of He atoms driven by strain gradient in Nb film close to Nb/MgO interface. This study could provide novel mechanisms for further understanding the interface enhancing radiation tolerance.

Original languageEnglish
Pages (from-to)1014-1018
Number of pages5
JournalApplied Surface Science
Volume465
DOIs
StatePublished - Jan 28 2019

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