Abstract
The sintering process of ceramics involves mass transport across grain boundaries resulting in the migration of these boundaries. When there is a liquid at the interface-as in liquid-phase sintering-the mass transport can be enhanced. In this study, electron backscatter diffraction has been used to examine grain-boundary migration of controlled interfaces in alumina. The interfaces were prepared by hot pressing single-crystal and polycrystalline alumina to single-crystal alumina substrates of known orientation. EBSD patterns, taken near the sintered interfaces, have been used to study the effects of crystallography on migration direction and rate. © 2006 Springer Science + Business Media, Inc.
| Original language | English |
|---|---|
| Pages (from-to) | 661-674 |
| Number of pages | 14 |
| Journal | Journal of Materials Science |
| Volume | 41 |
| Issue number | 3 |
| DOIs | |
| State | Published - Feb 1 2006 |
| Externally published | Yes |
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