Abstract
The first observations of stacking-fault tetrahedra in ion-implanted III-V compounds are reported. The structure and orientation of the stacking-fault tetrahedra are briefly described. The tetrahedra are present in the near-surface region that recrystallized during the annealing. High-resolution images suggest that the stacking-fault tetrahedra are of the vacancy type. © 1987 Taylor & Francis Group, LLC.
| Original language | English |
|---|---|
| Pages (from-to) | 85-90 |
| Number of pages | 6 |
| Journal | Philosophical Magazine Letters |
| Volume | 56 |
| Issue number | 3 |
| DOIs | |
| State | Published - Jan 1 1987 |
| Externally published | Yes |
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