The optical properties of conjugated materials and their aggregates: Towards imaging of films and devices

Linda A. Peteanu; Jiyun Hong; Sukyung Jeon; Janice Kim; Diane Devi; Jurjen Wildeman; Matthew Y. Sfeir; James H. Werner; Andrew P. Shreve

doi:10.1117/12.2063460

The optical properties of conjugated materials and their aggregates: Towards imaging of films and devices

Linda A. Peteanu
, Jiyun Hong
, Sukyung Jeon
, Janice Kim
, Diane Devi
, Jurjen Wildeman
, Matthew Y. Sfeir
, James H. Werner
, Andrew P. Shreve

Los Alamos National Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Applications of conjugated polymers in photovoltaics and displays drive the need to understand how morphology affects emission and charge migration. Due to the inherent complexity of polymers, parallel studies of oligomer aggregates are required to â€build-up' an understanding of the polymer features. Fluorescence lifetime imaging microscopy (FLIM) is used to probe variations in vibronic patterns and emission lifetime between individual aggregates and trends in these properties as a function of aggregate size. This technique yields insight into the structure and packing properties of these materials in the aggregated state.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9165
DOIs	https://doi.org/10.1117/12.2063460
State	Published - Jan 1 2014

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title = "The optical properties of conjugated materials and their aggregates: Towards imaging of films and devices",

abstract = "Applications of conjugated polymers in photovoltaics and displays drive the need to understand how morphology affects emission and charge migration. Due to the inherent complexity of polymers, parallel studies of oligomer aggregates are required to {\^a}€build-up' an understanding of the polymer features. Fluorescence lifetime imaging microscopy (FLIM) is used to probe variations in vibronic patterns and emission lifetime between individual aggregates and trends in these properties as a function of aggregate size. This technique yields insight into the structure and packing properties of these materials in the aggregated state.",

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AU - Peteanu, Linda A.

AU - Hong, Jiyun

AU - Jeon, Sukyung

AU - Kim, Janice

AU - Devi, Diane

AU - Wildeman, Jurjen

AU - Sfeir, Matthew Y.

AU - Werner, James H.

AU - Shreve, Andrew P.

PY - 2014/1/1

Y1 - 2014/1/1

N2 - Applications of conjugated polymers in photovoltaics and displays drive the need to understand how morphology affects emission and charge migration. Due to the inherent complexity of polymers, parallel studies of oligomer aggregates are required to â€build-up' an understanding of the polymer features. Fluorescence lifetime imaging microscopy (FLIM) is used to probe variations in vibronic patterns and emission lifetime between individual aggregates and trends in these properties as a function of aggregate size. This technique yields insight into the structure and packing properties of these materials in the aggregated state.

AB - Applications of conjugated polymers in photovoltaics and displays drive the need to understand how morphology affects emission and charge migration. Due to the inherent complexity of polymers, parallel studies of oligomer aggregates are required to â€build-up' an understanding of the polymer features. Fluorescence lifetime imaging microscopy (FLIM) is used to probe variations in vibronic patterns and emission lifetime between individual aggregates and trends in these properties as a function of aggregate size. This technique yields insight into the structure and packing properties of these materials in the aggregated state.

UR - https://www.scopus.com/pages/publications/84922709215

U2 - 10.1117/12.2063460

DO - 10.1117/12.2063460

M3 - Conference contribution

SN - 9781628411928

VL - 9165

BT - Proceedings of SPIE - The International Society for Optical Engineering

ER -

The optical properties of conjugated materials and their aggregates: Towards imaging of films and devices

Abstract

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