Abstract
A new thin film substrate for the study of solid-state phase transformations is described. Thin films of the `seeding' material are grown onto suitable substrates. These films then form the substrate onto which the sol is deposited. The extent and crystallography of the transformation can then be evaluated with both scanning electron microscopy and transmission electron microscopy. To demonstrate the procedure, thin films of α-Fe2O3 were grown by pulsed laser ablation onto specially prepared single crystal (0001) α-Al2O3 substrates.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Pages | 532-533 |
| Number of pages | 2 |
| State | Published - Dec 1 1994 |
| Externally published | Yes |
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