Abstract
The present paper studies the pulsed-laser deposited (PLD) TiO2 onto MgO. Pre-characterized 'TEM-ready' substrates are used thereby circumventing the possibility of affecting the film morphology during the thinning process. This technique also allows the imaging in the TEM of identical areas both before and after deposition.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Pages | 1142-1143 |
| Number of pages | 2 |
| State | Published - Dec 1 1993 |
| Externally published | Yes |
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