Top-bottom effects in double diffraction

Lisa A. Tietz; C. Barry Carter; Stuart McKernan

doi:10.1016/0304-3991(95)00067-2

Top-bottom effects in double diffraction

Lisa A. Tietz
, C. Barry Carter
, Stuart McKernan

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

A top-bottom effect in double diffraction has been observed in selected-area diffraction (SAD) patterns recorded from epitactic overgrowths. In SAD patterns recorded from epitactic α-Fe2O3 islands grown on an (0001) Al2O3 substrate, the double-diffraction reflections were found always to surround the primary reflections associated with the bottom crystal. This observation is explained using simple geometric constructions and the concepts of kinematical diffraction in a deformed crystal. The effect may be useful as a simple method for determining on which side of a TEM specimen a particular epitactic feature lies. © 1995.

Original language	English
Pages (from-to)	241-246
Number of pages	6
Journal	Ultramicroscopy
Volume	60
Issue number	2
DOIs	https://doi.org/10.1016/0304-3991(95)00067-2
State	Published - Jan 1 1995
Externally published	Yes

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title = "Top-bottom effects in double diffraction",

abstract = "A top-bottom effect in double diffraction has been observed in selected-area diffraction (SAD) patterns recorded from epitactic overgrowths. In SAD patterns recorded from epitactic α-Fe2O3 islands grown on an (0001) Al2O3 substrate, the double-diffraction reflections were found always to surround the primary reflections associated with the bottom crystal. This observation is explained using simple geometric constructions and the concepts of kinematical diffraction in a deformed crystal. The effect may be useful as a simple method for determining on which side of a TEM specimen a particular epitactic feature lies. {\textcopyright} 1995.",

author = "Tietz, \{Lisa A.\} and \{Barry Carter\}, C. and Stuart McKernan",

year = "1995",

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doi = "10.1016/0304-3991(95)00067-2",

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TY - JOUR

T1 - Top-bottom effects in double diffraction

AU - Tietz, Lisa A.

AU - Barry Carter, C.

AU - McKernan, Stuart

PY - 1995/1/1

Y1 - 1995/1/1

N2 - A top-bottom effect in double diffraction has been observed in selected-area diffraction (SAD) patterns recorded from epitactic overgrowths. In SAD patterns recorded from epitactic α-Fe2O3 islands grown on an (0001) Al2O3 substrate, the double-diffraction reflections were found always to surround the primary reflections associated with the bottom crystal. This observation is explained using simple geometric constructions and the concepts of kinematical diffraction in a deformed crystal. The effect may be useful as a simple method for determining on which side of a TEM specimen a particular epitactic feature lies. © 1995.

AB - A top-bottom effect in double diffraction has been observed in selected-area diffraction (SAD) patterns recorded from epitactic overgrowths. In SAD patterns recorded from epitactic α-Fe2O3 islands grown on an (0001) Al2O3 substrate, the double-diffraction reflections were found always to surround the primary reflections associated with the bottom crystal. This observation is explained using simple geometric constructions and the concepts of kinematical diffraction in a deformed crystal. The effect may be useful as a simple method for determining on which side of a TEM specimen a particular epitactic feature lies. © 1995.

UR - https://www.scopus.com/pages/publications/0029360478

U2 - 10.1016/0304-3991(95)00067-2

DO - 10.1016/0304-3991(95)00067-2

M3 - Article

SN - 0304-3991

VL - 60

SP - 241

EP - 246

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 2

ER -

Top-bottom effects in double diffraction

Abstract

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