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Transition alumina structures studied using HREM

  • K. J. Morrissey
  • , K. K. Czanderna
  • , R. P. Merrill
  • , C. B. Carter

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

High-resolution electron microscopy (HREM) has been used to study thin films of transition aluminas. The forms of Al2O3 studied were γ-Al2O3, δ-Al2O3, and θ-Al2O3. Acomparison of information obtained using selected-area diffraction (SAD) and HREM is made, and HREM is shown to be a necessary part of the analysis of these forms of alumina. © 1985.
Original languageEnglish
Pages (from-to)379-385
Number of pages7
JournalUltramicroscopy
Volume18
Issue number1-4
DOIs
StatePublished - Jan 1 1985
Externally publishedYes

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