Trapping of implanted He at Cu/Nb interfaces measured by neutron reflectometry

Mikhail Zhernenkov; Michael S. Jablin; Amit Misra; Michael Nastasi; Yongqiang Wang; Michael J. Demkowicz; Jon Kevin Scott Baldwin; Jaroslaw Majewski

doi:10.1063/1.3600642

Trapping of implanted He at Cu/Nb interfaces measured by neutron reflectometry

Mikhail Zhernenkov
, Michael S. Jablin
, Amit Misra
, Michael Nastasi
, Yongqiang Wang
, Michael J. Demkowicz
, Jon Kevin Scott Baldwin
, Jaroslaw Majewski

Los Alamos National Laboratory

Research output: Contribution to journal › Article › peer-review

41 Scopus citations

Abstract

Neutron reflectometry is used to characterize physical vapor deposited [Cu/Nb]_x/Si layered nanocomposites exposed to extreme helium ion doses. The effects of He ions on the interfacial roughness, layer swelling, and chemical mixing have been measured. Regions of high He concentration were localized at Cu/Nb interfaces while bulk Cu and Nb layers remained intact. This remarkable behavior is attributed to the efficient trapping and storage of He at interfaces as compared to bulk.

Original language	English
Article number	241913
Journal	Applied Physics Letters
Volume	98
Issue number	24
DOIs	https://doi.org/10.1063/1.3600642
State	Published - Jun 13 2011

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10.1063/1.3600642

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title = "Trapping of implanted He at Cu/Nb interfaces measured by neutron reflectometry",

abstract = "Neutron reflectometry is used to characterize physical vapor deposited [Cu/Nb]x/Si layered nanocomposites exposed to extreme helium ion doses. The effects of He ions on the interfacial roughness, layer swelling, and chemical mixing have been measured. Regions of high He concentration were localized at Cu/Nb interfaces while bulk Cu and Nb layers remained intact. This remarkable behavior is attributed to the efficient trapping and storage of He at interfaces as compared to bulk.",

author = "Mikhail Zhernenkov and Jablin, \{Michael S.\} and Amit Misra and Michael Nastasi and Yongqiang Wang and Demkowicz, \{Michael J.\} and Baldwin, \{Jon Kevin Scott\} and Jaroslaw Majewski",

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AU - Zhernenkov, Mikhail

AU - Jablin, Michael S.

AU - Misra, Amit

AU - Nastasi, Michael

AU - Wang, Yongqiang

AU - Demkowicz, Michael J.

AU - Baldwin, Jon Kevin Scott

AU - Majewski, Jaroslaw

PY - 2011/6/13

Y1 - 2011/6/13

N2 - Neutron reflectometry is used to characterize physical vapor deposited [Cu/Nb]x/Si layered nanocomposites exposed to extreme helium ion doses. The effects of He ions on the interfacial roughness, layer swelling, and chemical mixing have been measured. Regions of high He concentration were localized at Cu/Nb interfaces while bulk Cu and Nb layers remained intact. This remarkable behavior is attributed to the efficient trapping and storage of He at interfaces as compared to bulk.

AB - Neutron reflectometry is used to characterize physical vapor deposited [Cu/Nb]x/Si layered nanocomposites exposed to extreme helium ion doses. The effects of He ions on the interfacial roughness, layer swelling, and chemical mixing have been measured. Regions of high He concentration were localized at Cu/Nb interfaces while bulk Cu and Nb layers remained intact. This remarkable behavior is attributed to the efficient trapping and storage of He at interfaces as compared to bulk.

UR - https://www.scopus.com/pages/publications/79960585467

U2 - 10.1063/1.3600642

DO - 10.1063/1.3600642

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JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Trapping of implanted He at Cu/Nb interfaces measured by neutron reflectometry

Abstract

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