Abstract
A novel scanning tunneling microscope (STM) tip is described which consists of a cleaved GaAs substrate with a 1-μm-thick epilayer of low-temperature-grown GaAs (LT-GaAs) deposited on the face. As an application, the tip is used to detect picosecond transients on a coplanar stripline. A temporal resolution of 1.2 ps in tunneling mode is demonstrated.
| Original language | English |
|---|---|
| State | Published - Jan 1 1998 |
| Event | 1998 Conference on Lasers and Electro-Optics, CLEO - Duration: Jan 1 1998 → … |
Conference
| Conference | 1998 Conference on Lasers and Electro-Optics, CLEO |
|---|---|
| Period | 01/1/98 → … |
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