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Ultrafast scanning tunneling microscopy using a photoexcited low-temperature-grown GaAs tip

Research output: Contribution to conferencePaper

Abstract

A novel scanning tunneling microscope (STM) tip is described which consists of a cleaved GaAs substrate with a 1-μm-thick epilayer of low-temperature-grown GaAs (LT-GaAs) deposited on the face. As an application, the tip is used to detect picosecond transients on a coplanar stripline. A temporal resolution of 1.2 ps in tunneling mode is demonstrated.

Original languageEnglish
StatePublished - Jan 1 1998
Event1998 Conference on Lasers and Electro-Optics, CLEO -
Duration: Jan 1 1998 → …

Conference

Conference1998 Conference on Lasers and Electro-Optics, CLEO
Period01/1/98 → …

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