Abstract
Continuous fullerene films (85% C60, 15% C70) of thickness ∼10 nm have been sublimed on a metallic substrate previously coated with a 1-nm-thick Ge sublayer. The films show no surface potential variations when scanned with a Kelvin probe of 1 mV and 1 mm potential and spatial resolutions. Transmission electron microscopy reveals the fullerene films to be amorphous.
| Original language | English |
|---|---|
| Pages (from-to) | 455-457 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 63 |
| Issue number | 4 |
| DOIs | |
| State | Published - Dec 1 1993 |
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