Skip to main navigation Skip to search Skip to main content

Zeroth order Fabry-Perot resonance enabled ultra-thin perfect light absorber using percolation aluminum and silicon nanofilms

  • Seyed Sadreddin Mirshafieyan
  • , Ting S. Luk
  • , Junpeng Guo

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

We demonstrated perfect light absorption in optical nanocavities made of ultra-thin percolation aluminum and silicon films deposited on an aluminum surface. The total layer thickness of the aluminum and silicon films is one order of magnitude less than perfect absorption wavelength in the visible spectral range. The ratio of silicon cavity layer thickness to perfect absorption wavelength decreases as wavelength decreases due to the increased phase delays at silicon-aluminum boundaries at shorter wavelengths. It is explained that perfect light absorption is due to critical coupling of incident wave to the fundamental Fabry-Perot resonance mode of the structure where the round trip phase delay is zero. Simulations were performed and the results agree well with the measurement results.
Original languageEnglish
Pages (from-to)1032-1042
Number of pages11
JournalOptical Materials Express
Volume6
Issue number4
DOIs
StatePublished - Apr 1 2016
Externally publishedYes

Fingerprint

Dive into the research topics of 'Zeroth order Fabry-Perot resonance enabled ultra-thin perfect light absorber using percolation aluminum and silicon nanofilms'. Together they form a unique fingerprint.

Cite this